Dr. Marie-Lise Flottes received her M.S. degree in Electrical Engineering and PhD degree in Microelectronics from the University of Montpellier, France, in 1987 and 1990 respectively. She is currently a researcher for the CNRS.
Since 1990, she has been conducting research in the domain of digital system testing. Her research interests include Test of and Design-for-Testability of digital devices, hardware security and trust with a focus since early 2000 on testability and fault tolerance of circuits dedicated to secure applications, attacks using test infrastructures and related countermeasures.