L. Aksoy, Q.-L. Nguyen, F. Almeida, J. Raik, M.-L. Flottes, S. Dupuis, S. Pagliarini “High-level Intellectual Property Obfuscation via Decoy Constants”

June 2021

27th IEEE International Symposium on On-Line Testing and Robust System Design

Link: https://arxiv.org/abs/2105.06122

DOI: 10.1109/IOLTS52814.2021.9486714.